Method of fabricating two level interconnects and fuse on an IC

Chemistry: electrical and wave energy – Processes and products – Vacuum arc discharge coating

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204192E, C23C 1500

Patent

active

041849337

ABSTRACT:
A method of forming fuses and two level interconnects including applying a layer of fusible material on an insulating layer and through contact apertures, cleaning said fusible layer by sputter etching, applying a layer of metallic material by sputtering, selectively patterning the metallic layer to form a top layer of contacts and interconnects and selectively patterning the fusible layer to form fusible elements and to form a bottom layer of contacts and interconnects.

REFERENCES:
patent: 3567508 (1971-03-01), Cox et al.
patent: 3794517 (1974-02-01), Yperman
patent: 3856648 (1974-12-01), Fuller et al.
W. H. Legat et al., "Application of Sputtering in the Formation of Semi-conductor Devices", Solid State Technology, Dec. 1970, pp. 54-57.

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