Method of fabricating SOI substrate with uniform thin silicon fi

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437 62, 437974, 148DIG135, 148DIG127, H01L 21465

Patent

active

052408833

ABSTRACT:
A thin Silicon film On Insulator (SOI) material fabricating method which is capable of providing a very high thickness uniformity of the silicon film, a process simplification and a considerable reduction of processing cost is disclosed, in which a silicon oxide film is formed on one or both of a p-type silicon bond wafer and a silicon base wafer, then the two wafers are bonded together through the silicon oxide film, subsequently a fixed positive charge is induced in the silicon oxide film to form a n-type inversion layer in the p-type silicon bond wafer adjacent to an interface between the p-type silicon bond wafer and the silicon oxide film layer, and thereafter a chemical etching is effected while applying a positive voltage to the p-type silicon bond wafer so that an etch-stop is made at an interface between a depletion layer including the n-type inversion layer and the p-type layer.

REFERENCES:
patent: 4601779 (1986-07-01), Abernathy et al.
patent: 4649627 (1987-03-01), Abernathy et al.
patent: 4983251 (1991-01-01), Haisma et al.
patent: 5013681 (1991-05-01), Godbey et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of fabricating SOI substrate with uniform thin silicon fi does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of fabricating SOI substrate with uniform thin silicon fi, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating SOI substrate with uniform thin silicon fi will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2297138

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.