Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material
Reexamination Certificate
2007-07-27
2009-08-11
Doan, Theresa T (Department: 2814)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Grooved and refilled with deposited dielectric material
C438S426000, C438S427000, C257S510000
Reexamination Certificate
active
07572713
ABSTRACT:
A semiconductor device such as a flash memory includes a semiconductor substrate having a surface, and a plurality of trenches formed in the substrate so as to be open at the surface of the substrate, the trenches having opening widths different from each other. The trench with a smaller opening width is formed so as to have a first depth and the trench with a larger opening width has a bottom including opposite ends each of which has a second depth deeper than the first depth and a central portion shallower than the second depth.
REFERENCES:
patent: 5683932 (1997-11-01), Bashir et al.
patent: 6440819 (2002-08-01), Luning
patent: 6531402 (2003-03-01), Nakagawa
patent: 7265022 (2007-09-01), Ito et al.
patent: 2000-156402 (2000-06-01), None
Ito Katsuya
Matsumoto Takanori
Tsunoda Hiroaki
Doan Theresa T
Kabushiki Kaisha Toshiba
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
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