Method of fabricating semiconductor device

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437189, 437190, 437183, 437245, 437246, H01L 2144

Patent

active

050949799

ABSTRACT:
In a method of fabricating a semiconductor device, a conductive thin film is first removed by anisotropic etching through masks of electrodes having fine patterns. Thus, the conductive thin film is prevented from side etching in electrode portions, to thereby prevent electrode separation and V.sub.EBF failure. Then, the electrodes are covered with a resist film, to remove a part of the conductive thin film left on a concave step portion of a non-electrode forming region by isotropic etching. Thus, a problem of shorting across a base and an emitter caused by movement on the basis of separation of the conductive thin film is solved.

REFERENCES:
patent: 3571913 (1971-03-01), Bodway
patent: 4816424 (1989-03-01), Watanabe et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of fabricating semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of fabricating semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2284486

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.