Method of fabricating semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Dram with capacitor electrodes used for accessing

Reexamination Certificate

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C257S296000

Reexamination Certificate

active

06849959

ABSTRACT:
A method of fabricating a semiconductor device according to the invention comprises forming a capacitor comprising a lower electrode formed on a semiconductor substrate, a capacitive insulator made up of a metal oxide film, formed on the lower electrode, and an upper electrode formed on the capacitive insulator; forming a metal pattern to be electrically connected to the electrodes of the capacitor; forming a first protection film which coats at least a side face of the metal pattern; and forming a water constituents diffusion preventive film on the side face and top face of the metal pattern through the intermediary of the first protection film. As a result, a method of fabricating a ferroelectric memory capable of protecting a ferroelectric capacitor from water constituents evolved during a fabrication process, and maintaining satisfactory memory characteristics can be provided.

REFERENCES:
patent: 6211096 (2001-04-01), Allman et al.
patent: 6346741 (2002-02-01), Van Buskirk et al.
patent: 6635529 (2003-10-01), Inomata
patent: 07-111318 (1995-04-01), None
patent: 08-037282 (1996-02-01), None
patent: 2001-060669 (2001-03-01), None
patent: 2001-217397 (2001-08-01), None
patent: 2002-176149 (2002-06-01), None

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