Method of fabricating scanning tunneling microscope tips

Chemistry: electrical and wave energy – Processes and products – Electrostatic field or electrical discharge

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20412955, 20412975, 156625, C25F 302, C25F 316

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active

050857460

ABSTRACT:
A method of fabricating a double-tapered scanning tunneling microscope comprises (a) immersing one end of the tip in a bath of an acidic aqueous etchant solution containing an alkaline earth salt, with the wire positioned substantially perpendicularly to the surface of the solution; and (b) etching the wire at about 25 volts root mean squared (rms) alternating current (ac) until a double-tapered tip is formed thereon. The etching step is preferably followed by a polishing step which comprises (c) providing a thin film of a second acidic aqueous etchant solution containing an alkaline earth salt; then (d) contacting said electrode tip to the thin film: and then (e) etching the tip at about 2 volts rms ac to thereby polish the tip.
Also disclosed is a method inhibiting the formation of carbon on a scanning tunneling microscope tip which comprises (a) positioning a wire in an etchant solution and then (b) etching the wire while excluding carbon dioxide therefrom.
Double-tapered scanning tunneling microscope tip comprised of an elongate wire and methods of using the same are also disclosed.

REFERENCES:
patent: 2430028 (1947-11-01), Pfann et al.
patent: 2607724 (1952-08-01), Laing
patent: 3524803 (1970-08-01), Rannefeld
patent: 3556953 (1971-01-01), Schulz
patent: 4375396 (1983-03-01), Beggs et al.
patent: 4452677 (1984-06-01), Richardson
patent: 4469554 (1984-09-01), Turner
patent: 4473771 (1984-09-01), Lhotsky et al.
Sybalsky, J., IBM Technical Disc. Bull., vol. 13, #12, May 1971, "Protective Atmosphere For Basic Etch Sol'ns".
Allan J. Melmed, Helium Field-On Microscopy of Hexagonal Close-Packed Metals, Surface Science 8(1967), 191-205.
Field Ion Microscopy, American Elsevier Publishing Co., Inc., New York, pp. 119-127.
Journal De Physique, O. Nishikawa, Field Ion Microscope and Atom-Probe Studies of Scanning Tunneling Microscope Tips, pp. C6-55-C6-59.
Andrew A. Gewirth, J. Electroanal. Chem. 261 (1989), pp. 477-482, Fabrication and Characterization of Microtips For In Situ Scanning Tunneling Microscopy.
Ruth Nicolaides, J. Vac. Sci. Technol. A6(2), Mar./Apr. 1988, pp. 445-447, Scanning Tunneling Microscope Tip Structures.
M. Gehrtz, J. Vac. Sci. Technol. A6(2), Mar./Apr. 1988, pp. 432-435, Scanning Tunneling Microscopy of Machined Surfaces.
Michael J. Herben, Journal of Microscopy, vol. 152, Pt. 3, Dec. 1988, pp. 651-661, Preparation of STM Tips For In-Situ Characterization of Electrode Surfaces.
C. T. J. Ahlers, J. Appl. Phys. 38(2), Feb. 1967, Electropolishing of Platinum Foils at -35.degree. C. for Transmission Electron Microscopy.

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