Active solid-state devices (e.g. – transistors – solid-state diode – Alignment marks
Reexamination Certificate
2007-02-20
2007-02-20
Nhu, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Alignment marks
C257S002000, C257S059000
Reexamination Certificate
active
10848048
ABSTRACT:
A method of fabricating polycrystalline silicon includes: forming a semiconductor layer of amorphous silicon on a substrate having a first region and a second region surrounding the first region; forming a plurality of flat align keys in the second region using a first mask; forming a plurality of convex align keys by etching the semiconductor layer in the first region, the plurality of convex align keys having steps against the substrate; and crystallizing the semiconductor layer in the first region by aligning a second mask with respect to the plurality of convex align keys.
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Robert S. Sposilli et al.; Material Research Society; vol. 452, 1997; pp. 956-957.
Birch & Stewart Kolasch & Birch, LLP
LG.Philips LCD Co. , Ltd.
Nhu David
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