Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Substrate dicing
Reexamination Certificate
2006-05-09
2006-05-09
Guerrero, Maria F. (Department: 2822)
Semiconductor device manufacturing: process
Making device or circuit emissive of nonelectrical signal
Substrate dicing
C438S042000, C438S046000, C438S460000
Reexamination Certificate
active
07041523
ABSTRACT:
In a wafer having an LD structure251formed on a GaN-based substrate250, cleavage guide grooves252are formed in its surface by scribing from above the LD structure251with a diamond needle. The cleavage guide grooves252are formed one along each of stripe-shaped waveguides253formed parallel to the <1-100> direction of the wafer, and are formed in the shape of broken lines in the <11-20> direction of the wafer.
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Ito Shigetoshi
Kawakami Toshiyuki
Omi Susumu
Yamasaki Yukio
Guerrero Maria F.
Morrison & Foerster / LLP
Sharp Kabushiki Kaisha
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