Method of fabricating an ink jet nozzle arrangement

Etching a substrate: processes – Forming or treating thermal ink jet article

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C216S083000, C347S065000

Reexamination Certificate

active

06998062

ABSTRACT:
A method of fabricating an ink jet nozzle arrangement including the steps of providing a silicon wafer. A plurality of permanent layers are deposited on one side of the wafer. A nozzle region or chamber is etched in the permanent layers to the silicon wafer level. An actuator and ink ejection port are etched on at least one permanent layer so that the ink ejection port is in communication with the nozzle chamber for effecting ink ejection.

REFERENCES:
patent: 4855567 (1989-08-01), Mueller
patent: 5812159 (1998-09-01), Anagnostopoulos et al.
patent: 5820771 (1998-10-01), Burke et al.
patent: 5896155 (1999-04-01), Lebens et al.
patent: 6007187 (1999-12-01), Kashino et al.
patent: 6126846 (2000-10-01), Silverbrook
patent: 6171875 (2001-01-01), Silverbrook
patent: 6228668 (2001-05-01), Silverbrook
patent: 6245246 (2001-06-01), Silverbrook
patent: 6247790 (2001-06-01), Silverbrook
patent: 6258285 (2001-07-01), Silverbrook
patent: 6267904 (2001-07-01), Silverbrook
patent: 6274056 (2001-08-01), Silverbrook
patent: 6712986 (2004-03-01), Silverbrook et al.
patent: 0416540 (1991-03-01), None
patent: 404001051 (1992-01-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of fabricating an ink jet nozzle arrangement does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of fabricating an ink jet nozzle arrangement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating an ink jet nozzle arrangement will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3705366

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.