Method of fabricating a semiconductor device

Semiconductor device manufacturing: process – Having organic semiconductive component

Reexamination Certificate

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Reexamination Certificate

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07049169

ABSTRACT:
According to the present invention, by applying a basic surface-processing agent to a film underlying a resist, the excessive photoacid present at the interface between the resist and the front-end film is neutralized and the pattern shape can be controlled. The present invention provides a method of manufacturing a semiconductor device including the steps of, forming an insulating film on a surface, applying a surface processing agent containing of at least a solvent and a basic component on the insulating film, applying a resist on the insulating film thus applied with the surface processing agent, patterning the resist by lithography, and transferring a resist pattern to the insulating film by a dry etching process.

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patent: 6692884 (2004-02-01), Fujimori et al.
patent: 2004/0259029 (2004-12-01), Nagahara et al.
patent: 0838727 (1997-10-01), None
patent: 2001-100400 (2001-04-01), None
patent: WO99/15935 (1999-04-01), None
Stanley Wolf Silicon Processing for the VSLI Era vol. 1 Lattice Press 1986 p. 518.

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