Method of extending the operational period of a...

Details Method of extending the operational period of a... Method of extending the operational period of a...

2006-02-28

2006-02-28

McKinnon, Terrell (Department: 3753)

Heat exchange

Heat transmitter

C165S080300, C361S688000, C257S706000

Reexamination Certificate

active

07004243

ABSTRACT:
A heat-exchanger in a chip tester includes an electric heater and a heatsink which are joined together with a layer of an attach material. The operational period of this heat-exchanger is extended by a method which includes the steps of: 1) testing chips in the chip tester in a manner that puts the heat-exchanger through multiple temperature changes which keep the layer in a solid state and which induce stress-cracks in the layer; 2) subjecting the layer to a crack-healing temperature cycle in which the layer is melted at least partially and re-solidified; and thereafter, 3) repeating the testing step.

REFERENCES:
patent: 4384610 (1983-05-01), Cook et al.
patent: 4696578 (1987-09-01), Mansuria et al.
patent: 4902732 (1990-02-01), Itoh et al.
patent: 5290710 (1994-03-01), Haj-Ali-Ahmadi et al.
patent: 5864176 (1999-01-01), Babock et al.
patent: 5918665 (1999-07-01), Babcock et al.
patent: 5930893 (1999-08-01), Eaton
patent: 6069023 (2000-05-01), Bernier et al.
patent: 6343647 (2002-02-01), Kim et al.
patent: 6914446 (2005-07-01), Tustaniwskyj et al.

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