Method of expanding tester drive and measurement capability

Details Method of expanding tester drive and measurement capability Method of expanding tester drive and measurement capability

2009-07-07

2011-11-29

Hollington, Jermele M (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754010, C324S756030, C324S762010

Reexamination Certificate

active

08067951

ABSTRACT:
A probe card assembly can comprise an interface, which can be configured to receive from a tester test signals for testing an electronic device. The probe card assembly can further comprise probes for contacting the electronic device and electronic driver circuits for driving the test signals to ones of the probes.

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PCT/US2007/069798 International Search Report and Written Opinion, May 25, 2007.
Int'l Preliminary Report on Patentability, PCT application PCT/US2007/069798, Jan. 22, 2009, 6 pages.

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