Method of examining aperture diameter of disk substrate...

Details Method of examining aperture diameter of disk substrate... Method of examining aperture diameter of disk substrate...

2011-08-02

2011-08-02

Noland, Thomas P (Department: 2856)

Geometrical instruments

Gauge

Internal

Reexamination Certificate

active

07987610

ABSTRACT:
The present invention relates to a method of examining an aperture diameter of a disk substrate having a circular aperture in the central portion thereof, the method including: attempting to pass a standard sphere for the aperture diameter through the aperture; and inspecting the aperture diameter of the disk substrate, based on whether the sphere passes through the aperture or not. Furthermore, the present invention relates to an examination apparatus thereof.

REFERENCES:
patent: 1225314 (1917-05-01), Conrad
patent: 2826819 (1958-03-01), Esken
patent: 3581881 (1971-06-01), Hobbs, II
patent: 5351410 (1994-10-01), Hainneville
patent: 6050127 (2000-04-01), Rao et al.
patent: 6280294 (2001-08-01), Miyamoto
patent: 7013713 (2006-03-01), Webster et al.
patent: 52154986 (1977-12-01), None
patent: 57028201 (1982-02-01), None
patent: 59073716 (1984-04-01), None
patent: 61167809 (1986-07-01), None
patent: 63282601 (1988-11-01), None
patent: 03063501 (1991-03-01), None
patent: 07-198303 (1995-08-01), None
patent: 07328190 (1995-12-01), None
patent: 11-033886 (1999-02-01), None
patent: 11-221742 (1999-08-01), None

Affiliated with

Also associated with

Rating

Method of examining aperture diameter of disk substrate... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of examining aperture diameter of disk substrate..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of examining aperture diameter of disk substrate... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2636749