Method of evaluating the time left before gelation of a...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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C324S071100, C324S676000

Reexamination Certificate

active

06842016

ABSTRACT:
Non-destructive method allowing in-situ evaluation, in a sensitive and reproducible way, for a given thermosetting composition, of the time left before gelation of said composition as a function of a quantity measuring its dielectric behavior.

REFERENCES:
patent: 4777431 (1988-10-01), Day et al.
patent: 5210499 (1993-05-01), Walsh
patent: 5219498 (1993-06-01), Keller et al.
patent: 5432435 (1995-07-01), Strong et al.
patent: 5525155 (1996-06-01), Allen
patent: 5530369 (1996-06-01), Kleinmeyer
patent: 5680055 (1997-10-01), Seitz et al.
patent: 5872447 (1999-02-01), Hager, III
patent: 5898309 (1999-04-01), Becker et al.
patent: 6577958 (2003-06-01), Green et al.
patent: 4120573 (1992-12-01), None
patent: 19601947 (1997-09-01), None
patent: 0542508 (1993-05-01), None
patent: 2645275 (1990-10-01), None
patent: 9859151 (1998-12-01), None

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