Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science
Reexamination Certificate
2007-11-01
2009-12-01
Dunn, Drew A (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Earth science
C702S002000, C702S014000, C702S042000
Reexamination Certificate
active
07627428
ABSTRACT:
The present invention generally relates to methods for rapidly calculating the surface displacement that results from an arbitrarily shaped load on the surface of a layered substrate. Some embodiments include sparse direct calculations of surface displacement in combination with interpolation methods for estimating surface displacement at other points. Some embodiments include methods for reducing computer time required for calculating surface displacement caused by an arbitrarily shaped load on a layered surface.
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Bevis Michael
Han Feng
Pan Ernian
Zhou Hao
Zhu Ronghua
Crimaldi Joseph J.
Dunn Drew A
Roetzel and Andress
The University of Akron
Vo Hien X
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