X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2008-07-15
2008-07-15
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S080000, C378S087000, C378S088000
Reexamination Certificate
active
07400705
ABSTRACT:
Disclosed herein is a method of evaluating the performance of an ion-exchange film. In the method, small-angle scattering curves for the ion-exchange film at different humidities are obtained by an X-ray measuring apparatus that can detect X-rays scattered at small angles with respect to the axis of an X-ray applied to the ion-exchange film. From the positions of the peaks on the small-angle scattering curves and the X-ray intensities at these peaks, the change in the characteristic of the film, which accompanies change in the molecular structure (hence, ion-exchanging ability) of the ion-exchange film due to the change in humidity, is evaluated. The humidity ambient to the ion-exchange film can be adjusted by a humidity-adjusting device that comprises a vapor source, gas source, gas mixer and gas-introducing pipe.
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Hoshino Kazuhito
Iwasaki Yoshio
Artman Thomas R.
Buchanan & Ingersoll & Rooney PC
Glick Edward J.
Rigaku Corporation
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