Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-11-06
2009-12-08
Dunn, Drew A (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
Reexamination Certificate
active
07630852
ABSTRACT:
A method for analyzing IC system performance. The method includes receiving system variables that correspond to an IC system; normalizing the system variables; using an infinite dimensional Hilbert space, modeling a system response as a series of series of orthogonal polynomials; and, solving for coefficients of the series of orthogonal polynomials. A system equation or a simulated response may be used to solve for the coefficients. If a simulated response is used, the coefficients may be solved by using the statistical expectance of the product of the simulated system response and the series of orthogonal polynomials. Alternatively, a simulated system response may be used to generate coefficients by performing a least mean square fit.
REFERENCES:
patent: 6621860 (2003-09-01), Yamaguchi et al.
Sarma Vrudhula, Janet Wang and Praveen Ghanta, (Oct. 2006) “Hermite Polynomial based Interconnect Analysis in the Presence of Process Variations”, Proc. IEEE Trans. on Computer-Aided Design of Integrated Circuits 25(10): pp. 2001-2011.
Janet Wang, Praveen Ghanta and Sarma Vrudhula, “Stochastic Analysis of Interconnect Performance in the Presence of Process Variations”, Proc. IEEE Int'l Conf. On Computer-Aided Design (ICCAD), San Jose, Nov. 2004, pp. 880-886.
Bhardwaj Sarvesh
Ghanta Praveen
Vrudhula Sarma
Arizona Board of Regents
Cherry Stephen J
Dunn Drew A
McDonnell Boehnen & Hulbert & Berghoff LLP
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