Method of evaluating a solid state image sensor using frequency

Details Method of evaluating a solid state image sensor using frequency Method of evaluating a solid state image sensor using frequency

1989-09-22

1992-08-04

Groody, James J.

Facsimile and static presentation processing

Facsimile

Recording apparatus

358139, 358163, H04N 314, H04N 530

Patent

active

051363887

ABSTRACT:
A method of evaluating the characteristics of a solid state image sensor measures the unit cell output values of the sensor and assigns the output values to a predetermined rank, and counts the number of unit cells cumulatively in each rank, and then, by regarding the frequency distribution profile of the unit cell output values obtained in such way as the intrinsic electrical characteristics of the sensor, judges the picture quality of the sensor by using this frequency distribution profile.

REFERENCES:
patent: 4392157 (1983-07-01), Garcia et al.
patent: 4639775 (1987-01-01), Cohen et al.
patent: 4761685 (1988-08-01), Asaida et al.
"Testing CCD Image Sensors with ATE", Solid State Technology, Nov. 1986, No. 11, Port Washington, N.Y., Mark E. Jagiela.
"Film Quality From Electronics-Who Controls It?", Image Technology, Oct., 1987, No. 10, London, Gr. Britain, Nick Viliesid, MBKSTS, MRTS.
"Testing For A Solid-State Color Image Sensor", 1986 International Test Conf., 683-686, New York, T. Noguchi et al.

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