Method of etching adjacent layers

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

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438739, H01L 2170

Patent

active

057733686

ABSTRACT:
A method of manufacturing a semiconductor component includes sputtering a first metal layer (16) over a substrate (11), sputtering a second metal layer (17) over the first metal layer (16), selectively etching the second metal layer (17) versus the first metal layer (16), selectively etching the first metal layer (16) versus the second metal layer (17), and thereafter, selectively re-etching the second metal layer (17) versus the first metal layer (16).

REFERENCES:
patent: 3571913 (1971-03-01), Bodway
patent: 5130267 (1992-07-01), Kaya et al.

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