Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-09-05
2006-09-05
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S076210
Reexamination Certificate
active
07103491
ABSTRACT:
A method of estimating parameters of time series data using a Fourier transform is disclosed. The parameter estimation method of the present invention can directly estimate modes and parameters, indicating the characteristics of a dynamic system, on the basis of the Fourier transform of the time series data. Accordingly, the present invention is advantageous in that it can estimate parameters of the system through a single Fourier transform without repeatedly calculating a Fourier transform, thus shortening the time required to estimate the parameters.
REFERENCES:
patent: 6104984 (2000-08-01), Thorpe et al.
“Signal Processing & Linear Systems”. B.P. Lathi. Oxford University Press Inc., New York, NY. Copyright 1998. pp. 44-45,54-55,634-635,638-640.
Nam Hae Kon
Shim Kwan Shik
Barlow John
Moffat Jonathan
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