Method of estimating elastic and compositional parameters...

Details Method of estimating elastic and compositional parameters... Method of estimating elastic and compositional parameters...

2005-04-05

2005-04-05

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Earth science

C702S016000, C702S017000

Reexamination Certificate

active

06876928

ABSTRACT:
A method for determining from measured reflection data on a plurality of trace positions, a plurality of subsurface parameters. The method includes the steps of: preprocessing the measured reflection data into a plurality of partial or full stacks; specifying one or more initial subsurface parameters defining an initial subsurface model; specifying a wavelet or wavelet field for each of the partial or full stacks of the measured reflection data; calculating synthetic reflection data based on the specified wavelets and the initial subsurface parameters; optimizing an objective function, including the weighted difference between measured reflection data and synthetic reflection data for a plurality of trace positions simultaneously; and outputting the optimized subsurface parameters. A device for implementing this method is also included.

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