Method of establishing thresholds for image comparison

Details Method of establishing thresholds for image comparison Method of establishing thresholds for image comparison

1996-11-27

1998-08-25

Font, Frank G.

Optics: measuring and testing

Inspection of flaws or impurities

Having predetermined light transmission regions

356369, 25055942, 25055948, G01N 2100

Patent

active

057988307

ABSTRACT:
A method is described for optimizing intensity-comparison thresholds used to compare test and reference images for defect detection. Intensity differences between corresponding pixels in the two images that exceed a predefined threshold value are deemed defect pixels. According to the method, the pixels of the reference image are grouped according to their respective z values (elevation) to identify different physical layers of the reference surface. Because different surface layers can have different image properties, such as reflectance and image texture, the groups of pixels are analyzed separately to determine an optimal threshold value for each of the groups, and therefore for each layer of the reference surface.

REFERENCES:
patent: 2758502 (1956-08-01), Scott et al.
patent: 5479252 (1995-12-01), Worster

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