Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-08-22
2006-08-22
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S613000
Reexamination Certificate
active
07096133
ABSTRACT:
A method of establishing a benchmark for a figure of merit indicative of flicker noise of an amplifier circuit.
REFERENCES:
patent: 6072947 (2000-06-01), Roychowdhury et al.
patent: 2005/0100084 (2005-05-01), Moloudi
Baker Brian R.
Martin Samuel S.
National Semiconductor Corporation
Raymond Edward
Vedder Price Kaufman & Kammholz P.C.
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