Optics: measuring and testing – With sample preparation
Patent
1984-11-06
1987-05-12
Rosenberger, R. A.
Optics: measuring and testing
With sample preparation
356237, G01N 130
Patent
active
046645144
ABSTRACT:
A method of nondestructive testing of the surface of an object using vapor condensation, such as sputtering, evaporation, or gas disassociation, to lay a thin solid film upon the surface of the object to be tested. The film is either highly reflective or highly absorptive. Portions of the solid film are then removed from the surface, for example, by abrasion while the remaining coating material is in a pattern depending on anomalies. The surface is then irradiated and inspected under light and the differential reflection between the remaining coating material and the surface itself enhances the visibility of the crack or other surface characteristic. The technique is especially useful for detecting very small cracks in cutting or grinding implements made of compacted material.
REFERENCES:
patent: 3734628 (1973-05-01), Michishita et al.
patent: 3930407 (1976-01-01), Alburger
patent: 4112626 (1978-09-01), Watanabe et al.
patent: 4225228 (1980-09-01), DiMatteo
patent: 4258264 (1981-03-01), Kotera et al.
patent: 4337566 (1982-07-01), DiMatteo et al.
patent: 4349277 (1982-09-01), Mundy et al.
McGraw-Hill Encyclopedia of Science and Technology, Copyright 1971 by McGraw-Hill, Inc., "Metal Coatings", pp. 335-337 of vol. 8.
"Uncovering Hidden Flaws", by Carl Rain, pp. 49-55, Feb. 1984, High Technology.
Davis Jr. James C.
General Electric Company
Rosenberger R. A.
Webb II Paul R.
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