Semiconductor device manufacturing: process – Including control responsive to sensed condition – Optical characteristic sensed
Reexamination Certificate
2005-10-25
2005-10-25
Schillinger, Laura M (Department: 2813)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
Optical characteristic sensed
C438S633000
Reexamination Certificate
active
06958247
ABSTRACT:
In a new method of plating metal onto dielectric layers including small diameter vias and large diameter trenches, a surface roughness is created at least on non-patterned regions of the dielectric layer to enhance the uniformity of material removal in a subsequent chemical mechanical polishing (CMP) process.
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Marxsen Gerd
Mauersberger Frank
Nopper Markus
Preusse Axel
Advanced Micro Devices , Inc.
Dolan Jennifer M.
Schillinger Laura M
Williams Morgan & Amerson P.C.
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