Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-07-01
2008-07-01
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S716000, C324S719000
Reexamination Certificate
active
11671947
ABSTRACT:
A method of determining the time to failure of parallel electro migration test structures is described. The method generally includes the steps of: measuring the resistance of the complete structure; calculating the resistance of the n individual parallel structures from the measured resistance; calculating the resistance of the complete structure after the failure of m individual parallel structures, for m=1 to n; and recording the time of failure for each m as the time when the resistance is approximately the value predicted for m fails.
Foo Eu Gene Glen
Low Yong Han Frankie
Sim Kwang Ye
Harness & Dickey & Pierce P.L.C.
Nguyen Ha Tran
Nguyen Trung Q.
Systems on Silicon Manufacturing Co. Pte. Ltd.
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