Method of electrically testing semiconductor devices

Details Method of electrically testing semiconductor devices Method of electrically testing semiconductor devices

2005-01-11

2005-01-11

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

06842031

ABSTRACT:
A method of electrically testing a semiconductor device preferably includes connecting a common input/output signal channel (line) of a socket board to two or more data pins of the semiconductor device. Signals output from the semiconductor device may be sequentially read via the short-circuited input/output signal lines of the socket board by carrying out a byte operation function. The throughput of a semiconductor test system can thereby be increased by increasing the number of devices that can be tested in parallel.

REFERENCES:
patent: 5225775 (1993-07-01), Sekino
patent: 6360340 (2002-03-01), Brown et al.
patent: 6545497 (2003-04-01), Hebert et al.

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