Method of effecting liquid phase epitaxial growth of group III-V

Metal treatment – Process of modifying or maintaining internal physical... – Chemical-heat removing or burning of metal

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

148 335, 148172, 148 15, 156625, 156612, 331 945H, H01L 21208

Patent

active

040309495

ABSTRACT:
Disclosed is a method of yielding a multilayer-liquid phase epitaxial growth of Al.sub.x Ga.sub.1.sub.-x As and GaAs for manufacturing a double heterostructure laser, light emitting diode, etc., which is characterized in that hydrogen gas or inert gas, containing GaCl gas, is used as an atmosphere for the epitaxial growth. This method permits the liquid phase epitaxial growth of a semiconductor layer even on an Al.sub.x Ga.sub.1.sub.-x As (x .gtoreq. 0.3) which is once exposed to the air or subjected to an etching treatment. Accordingly, this method is suitable for the manufacture of a semiconductor element having a buried active layer. This method also permits the manufacture of an epitaxial wafer having a low dislocation density.

REFERENCES:
patent: 3294600 (1966-12-01), Yokota
patent: 3687744 (1972-08-01), Ogirima et al.
patent: 3755013 (1973-08-01), Hollan
patent: 3780358 (1973-12-01), Thompson
patent: 3933538 (1976-01-01), Akai et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of effecting liquid phase epitaxial growth of group III-V does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of effecting liquid phase epitaxial growth of group III-V, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of effecting liquid phase epitaxial growth of group III-V will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-734315

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.