Image analysis – Applications – Manufacturing or product inspection
Patent
1994-11-17
1997-03-04
Johns, Andrew
Image analysis
Applications
Manufacturing or product inspection
382270, G06K 936
Patent
active
056088140
ABSTRACT:
The method of producing a binary flaw-no flaw image of an object, including employing an ultrasonic data acquisition system to obtain data values f(i,j) which define a C-scan image (F) of the object, dividing the C-scan image (F) into a plurality of subimages (G.sub.k for k=1,2, . . . ,K), determining regional threshold levels y(k) for each of the plurality of subimages, using said regional threshold levels y(k) to determine pixel threshold levels t(i,j) for each pixel (i,j) of the image (F) by interpolation, and generating a binary flaw-no flaw image (B) by assigning binary values thereto based on a comparison between the pixel threshold levels t(i,j) and data values f(i,j), thereby providing a method which achieves a high probability of flaw detection and a low probability of false flaw indications.
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Gilmore Robert S.
Howard Patrick J.
General Electric Company
Goldman David C.
Johns Andrew
Snyder Marvin
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