Method of doping a body of amorphous semiconductor material by i

Metal treatment – Compositions – Heat treating

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148187, 357 2, 357 91, H01L 21263, H01L 4500

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041697405

ABSTRACT:
To provide for effective doping and obtain substantial conductivity change in amorphous semiconductor material, typically silicon, a body of said material is raised to a temperature above about 20.degree. C. and below the recrystallization temperature, for example in the range of between 100.degree. C., preferably above 200.degree.-250.degree. C. and below about 450.degree. C. during the ion implantation. The doping ions are, for example for silicon, of groups III and V of the periodic system, particularly boron and phosphorus. Semiconductor junctions can be made by this process by selectively doping spatially limited regions of the semiconductor body to thereby produce semiconductor components by doping with ions of different characteristics, for example of different conductivity type.

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patent: 4064521 (1977-12-01), Carlson
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Spear et al., ". . . Doped Amorphous Si and Ge", Phil. Mag. 33 (1976), 935.
Muller et al., "Doping of Amorphous Si . . .", Proc. 7th Intn. Conf. Amorphous . . . S/C, Edinburgh, Jun. 27, Jul. 1, 1977.
Muller et al., ". . . Hydrogen . . . Amorphous Si", Proc. 7th Conf. Amorphous . . . S/C. Edinburgh, Jun. 27-Jul. 1, 1977.
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