Method of displaying high-resolution distributions of physical p

Details Method of displaying high-resolution distributions of physical p Method of displaying high-resolution distributions of physical p

1989-04-28

1991-01-22

Boudreau, Leo H.

Image analysis

Histogram processing

For setting a threshold

364521, 340731, 340799, G06K 900

Patent

active

049876023

ABSTRACT:
A method of displaying a high-resolution distribution of the amount of physical parameters measured on a prescribed surface by a number of sensors with an electric output signal, especially pressures or forces acting at right angles on a stage that has a matrix of sensors, on a display.

REFERENCES:
patent: 4631691 (1986-12-01), Pica
patent: 4749990 (1988-06-01), Birkner
patent: 4785296 (1988-11-01), Tabata et al.

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