Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate
2005-11-29
2005-11-29
Thomson, B. D. (Department: 2123)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Circuit simulation
C703S019000, C716S030000, C714S726000, C714S729000
Reexamination Certificate
active
06970815
ABSTRACT:
A method of discriminating between different types of simulated scan failures includes simulating a scan enable signal to a circuit represented by a netlist corresponding to a scan chain coupled to combinatorial logic being tested, simulating initiation of a data capture cycle in the netlist corresponding to the scan chain, the data capture cycle simulating a series of scan flops from the scan chain being simulated together with the combinatorial logic and simulating scanning data out from each flop in the scan chain and into a test program. The test program extracts the simulated scan flops and graphically displays the simulated scan flops versus time.
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Bombal Jerome
Souef Laurent
Koninklijke Philips Electronics , N.V.
Thomson B. D.
Zawilski Peter
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