Method of digital extraction for accurate failure diagnosis

Details Method of digital extraction for accurate failure diagnosis Method of digital extraction for accurate failure diagnosis

2011-05-17

2011-05-17

Feliciano, Eliseo Ramos (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S118000, C702S120000, C702S182000

Reexamination Certificate

active

07945417

ABSTRACT:
A method for testing VLSI circuits comprises a two-pass diagnostic method for testing a circuit wherein a first pass comprises a conventional test flow wherein an ATPG tool generates a set of test patterns and identifies possible faulty nets within the circuit. A second pass focuses on a designated critical subset of the circuit extracted using a method for extracting a subset for failure diagnosis of the tested circuit. A second pass utilizes an extraction algorithm which extracts one or more critical subsets of the circuit in order to obtain more accurate failure diagnosis.

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