Method of diffusing aluminum into monocrystalline silicon

Metal treatment – Process of modifying or maintaining internal physical... – Chemical-heat removing or burning of metal

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

148187, H01L 21225

Patent

active

041993861

ABSTRACT:
Uniform aluminum diffusion into monocrystalline silicon is obtained by forming a polycrystalline silicon underlayer on the surface of a monocrystalline silicon body, depositing a layer of aluminum on the polycrystalline silicon underlayer by evaporation at a temperature of less than about 250.degree. C., depositing a silicon overlayer over said aluminum layer at a temperature less than about 250.degree. C. and raising the temperature of said structure to between 900.degree. C. and 1300.degree. C. to cause the aluminum to diffuse into said monocrystalline silicon.

REFERENCES:
patent: 2931743 (1960-04-01), Rittman
patent: 3067071 (1962-12-01), Mutter
patent: 3413157 (1968-11-01), Kuiper
patent: 3909926 (1975-10-01), Hutson
patent: 4029527 (1977-06-01), Glasl et al.
patent: 4029528 (1977-06-01), Rosnowski
patent: 4040878 (1977-08-01), Rowe
patent: 4050967 (1977-09-01), Rosnowski et al.
patent: 4099997 (1978-07-01), Rosnowski
patent: 4106051 (1978-08-01), Dormer et al.
patent: 4154632 (1979-05-01), Mochizuki et al.
Rai-Choudhury et al., J. Electrochem. Soc., May, 1977, pp. 762-766.
Rosnowski, J. Electrochem. Socl., Jun., 1978, pp. 957-962.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of diffusing aluminum into monocrystalline silicon does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of diffusing aluminum into monocrystalline silicon, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of diffusing aluminum into monocrystalline silicon will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1474031

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.