Semiconductor device manufacturing: process – Semiconductor substrate dicing – With attachment to temporary support or carrier
Reexamination Certificate
2008-06-17
2008-06-17
Coleman, W. David (Department: 2823)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
With attachment to temporary support or carrier
C438S033000, C438S068000, C438S107000, C438S113000, C257S618000, C257S622000
Reexamination Certificate
active
07387951
ABSTRACT:
The invention relates to a semiconductor wafer dicing method of dicing a semiconductor wafer along parting lines into chips. The semiconductor wafer in which parting lines along which the semiconductor wafer is diced into chips are formed is held by an adhesive tape. By radially drawing the adhesive tape in a state where the chips in the semiconductor wafer are not parted from each other, the chips are parted from each other and clearances among the chips are extended.
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Chinese Office Action for Chinese Patent Application No. 2005100562688 dated Feb. 15, 2008.
Miyamoto Saburo
Yamamoto Masayuki
Cheng Law Group PLLC
Coleman W. David
Kim Su C
Nitto Denko Corporation
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