Method of developing and stripping positive photoresist

Gas separation: apparatus – Electric field separation apparatus – Electrode cleaner – apparatus part flusher – discharger – or...

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96 33, 96 362, 96 363, 96 49, 156643, 156659, G03C 500, G03F 708

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active

040159868

ABSTRACT:
Baked novolak resin based positive photoresists are either developed after exposure or stripped, following the use of the pattern resist layer as an etch mask, in aqueous solutions of a combination of permanganate and phosphoric acid.

REFERENCES:
patent: 3046117 (1962-07-01), Sus
patent: 3180732 (1965-04-01), Sus et al.
patent: 3406065 (1968-10-01), Uhlig
patent: 3627685 (1971-12-01), Lam
patent: 3639185 (1972-02-01), Colom et al.
patent: 3759711 (1973-09-01), Rauner et al.
patent: 3814641 (1974-06-01), Reinberg et al.
patent: 3871929 (1975-03-01), Schevey et al.
patent: 3890152 (1975-06-01), Ruckert et al.
patent: 3930857 (1966-01-01), Bendz et al.
German et al., "J. of Photo Science", vol. 15, pp. 137-144, 5/1967.
Kaplan, "IBM Technical Discl. Bulletin", vol. 13, No. 2, 7/1970.
Kaplan et al., "IBM Technical Discl. Bulletin", vol. 14, No. 10, 3/1972.

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