Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2006-03-07
2006-03-07
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C703S022000
Reexamination Certificate
active
07010463
ABSTRACT:
A method of determining whether an improved item has a better mean lifetime than an existing item having a fully specified lifetime distribution function. A finite number n of examples of the new item are placed on life test, and the failure times of the n examples of the new item are recorded as they occur. At each occurrence of failure, the newly noted failure time is entered into a list of previously noted failure times and the most up-to-date statistical P-value is calculated for the life test so far. When the statistical P-value is sufficiently small there is statistical inference that the new item is better than the current one, and the test is ended.
REFERENCES:
patent: 5808908 (1998-09-01), Ghahramani
patent: 5893069 (1999-04-01), White, Jr.
patent: 6633177 (2003-10-01), Okada
patent: 6684349 (2004-01-01), Gullo et al.
patent: 6724214 (2004-04-01), Manna et al.
patent: 6795793 (2004-09-01), Shayegan et al.
Bugaighis, M., Exchange of Censorship Types and its Impact on the Estimation of Parameters of a Weibull Regression Model, Sep. 1995, IEEE Transactions on Reliability, vol. 44, No. 3, pp. 496-499.
Tang et al., Analysis of Step-Stress Accelerated-Life-Test Data: A New Approach, Mar. 1996, IEEE Transactions on Reliability, vol. 45, No. 1, pp. 69-74.
Gera, A., The Modified Exponential-Weibull Distribution for Life-Time Modeling, 1997, Proceedings Annual Reliability and Maintainability Symposium, pp. 149-152.
Fatatsuya, M., Prediction Intervals for System Lifetime, Based on Compoent Test Data, Dec. 4, 2000, IEEE Transactions on Reliability, vol. 49, No. 4, pp. 351-354.
Chandramouli et al., Sequential Tests for Integrated-Circuit Failures, Dec. 1998, IEEE Transaction on Reliability, vol. 47, No. 4, pp. 463-471.
Glen et al., APPL: A Probability Programming Language, May 2001, The American Statistician, vol. 55, No. 2, pp. 156-166.
Foote Bobbie L.
Glen Andrew G.
Bui Bryan
Klein Alan P.
Le Toan M.
The United States of America as represented by the Secretary of
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