Method of determining the x-ray limit of an ion gauge

Details Method of determining the x-ray limit of an ion gauge Method of determining the x-ray limit of an ion gauge

1979-08-07

1981-11-24

Anderson, Bruce C.

Radiant energy

Ion collectors

313 7, B01D 5944, H01J 4926

Patent

active

043026796

ABSTRACT:
An ion gauge having a reduced "x-ray limit" and means for measuring that limit. The gauge comprises an ion gauge of the Bayard-Alpert type having a short collector and having means for varying the grid-collector voltage.
The "x-ray limit" (i.e. the collector current resulting from x-rays striking the collector) may then be determined by the formula: ##EQU1## where: I.sub.x ="x-ray limit",

REFERENCES:
patent: 2829337 (1958-04-01), Groendijk
patent: 3267326 (1966-08-01), Hayward et al.

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