X-ray or gamma ray systems or devices – Accessory – Testing or calibration
Reexamination Certificate
2005-01-11
2005-01-11
Bruce, David V. (Department: 2882)
X-ray or gamma ray systems or devices
Accessory
Testing or calibration
C378S098800, C250S252100
Reexamination Certificate
active
06840674
ABSTRACT:
The invention relates to a method for the calibration of a radiation sensor, in which method a first calibration takes place with external radiation x and an internal signal s of the radiation sensor, and in which later calibrations are carried out exclusively with the internal signal. This enables the calculation of an approximate value x*(t) for the quantity of radiation x(t) absorbed in a radiation sensor (10) while taking into account a behavior of the radiation sensor that changes in time. First the primary characteristic ft1(x) is measured at a first instant t1; this characteristic describes the dependency of an output signal o on the absorbed quantity of radiation x. At the same time the secondary characteristic gt2(s) is measured, which characteristic describes the dependency of the output signal o on an internal signal s. The signals s and x should together form an intermediate signal w that is further processed with a function D(w,t) that varies in time in order to form the output signal o. The secondary characteristic is measured again at a later instant t3after the occurrence of aging; this measurement can be performed without utilizing (X) radiation. The calculation of the approximate value for the absorbed quantity of radiation can then be performed in conformity with the following formula:x*(t):=ft1-1(gt2(gt3-1(o(t)))).
REFERENCES:
patent: 4544843 (1985-10-01), Kern et al.
patent: 4611117 (1986-09-01), Seibert
patent: 6021173 (2000-02-01), Brauers et al.
patent: 6181773 (2001-01-01), Lee et al.
patent: 6404851 (2002-06-01), Possin et al.
patent: 0 387 799 (1990-09-01), None
patent: WO 0029872 (2000-05-01), None
Eck Kai
Schmidt Ralf
Bruce David V.
Kiknadze Irakli
Koninklijke Philips Electronics , N.V.
Serra Wayne M.
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