Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1990-03-15
1991-05-21
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With light attenuation
33707, G01B 1100, B23Q 1722
Patent
active
050170139
ABSTRACT:
The position of a reference point of a scanner relative to an incremental scale with marks arranged thereon with constant spacings is roughly determined based on the marks passed along the scale multiplied by the spacing of the marks, and finely determined by interpolation between the marks. The interpolation between the marks is made by determining the projection angles between the reference point and three marks adjacently arranged on the scale, and by calculating the coordinates of the reference point according to trigonometric functions.
REFERENCES:
patent: 3369444 (1968-02-01), Patrignani
patent: 3973119 (1976-08-01), Renes et al.
patent: 4585350 (1986-04-01), Pryor
E.M.S. Technik GmbH
Rosenberger Richard A.
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