Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1987-01-28
1988-08-09
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
356376, G01B 1130
Patent
active
047624191
ABSTRACT:
A method of rapidly determining surface relief of an object or a structure without making contact therewith based on quantifying the degree to which the image of an illuminated point or small spot on the surface is defocussed. Said point or spot is illuminated by a source of electromagnetic radiation such as a laser, and the relief is determined in the form of a profile where the height of any point on the profile is represented by the ratio of the energy values of two beams derived by splitting a single beam reflected from the surface under investigation: one of the beams acting as a reference and the other of the beams being limited by the action of a diaphragm and constituting a measurement beam.
REFERENCES:
patent: 3663107 (1972-05-01), Denis et al.
patent: 4017188 (1977-04-01), Sawartari
patent: 4088408 (1978-05-01), Burcher et al.
patent: 4548504 (1985-10-01), Morander
Sawatari et al., Optical Engineering, vol. 18, No. 2, Mar.-Apr. 1979, pp. 222-225.
Journal of Optics (Paris) vol. 14, No. 1, Jan.-Feb. 1983, pp. 19-23.
Caussignac Jean-Marie
Morel Gerard
Evans F. L.
Laboratoire Central des Ponts et Chaussees
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