Method of determining stress

Details Method of determining stress Method of determining stress

2006-10-30

2009-08-04

Caputo, Lisa M (Department: 2855)

Measuring and testing

Specimen stress or strain, or testing by stress or strain...

Specified electrical sensor or system

Reexamination Certificate

active

07568396

ABSTRACT:
A micromachined strain gauge comprising a plastically deformable piezoresistive microstructure formed on a surface of a substrate so that deformation of the substrate plastically deforms the microstructure to thereby change the resistance of the microstructure. The stress in the substrate can be determined from the change in the resistance of the microstructure.

REFERENCES:
patent: 2982127 (1961-05-01), Scott
patent: 4166384 (1979-09-01), Matsuda et al.
patent: 4605919 (1986-08-01), Wilner
patent: 4738146 (1988-04-01), Baumgartner et al.
patent: 4777826 (1988-10-01), Rud et al.
patent: 4939496 (1990-07-01), Destannes
patent: 5539158 (1996-07-01), Utsunomiya et al.
patent: 6469537 (2002-10-01), Akram et al.
patent: 6509201 (2003-01-01), Wright
patent: 6634113 (2003-10-01), Almaraz et al.
patent: 6816301 (2004-11-01), Schiller
patent: 7116209 (2006-10-01), Hermann et al.
patent: 2006/0001521 (2006-01-01), Nakao et al.

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