Optics: measuring and testing – Material strain analysis
Patent
1993-02-08
1993-12-14
Rosenberger, Richard A.
Optics: measuring and testing
Material strain analysis
428 1, 428409, 428480, 428913, 359 67, 359 74, 359 82, G01B 1116, C09K 1900
Patent
active
052707814
ABSTRACT:
The laminate structure comprises a liquid crystal polymer substrate attached to a test surface of an article. A light absorbing coating is applied to the substrate and is thin enough to permit bonding steric interaction between the liquid crystal polymer substrate and an overlying liquid crystal monomer thin film. Light is directed through and reflected by the liquid crystal monomer thin film and unreflected light is absorbed by the underlying coating. The wavelength of the reflected light is indicative of the shear stress experienced by the test surface.
REFERENCES:
patent: 4270050 (1981-05-01), Brogardh
patent: 4781455 (1988-11-01), Machler et al.
Eftekhari Abe
Parmar Devendra S.
Singh Jag J.
Chasteen Kimberly A.
Osborne Kevin B.
Pham Hoa Q.
Rosenberger Richard A.
The United States of America as represented by the Administrator
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