Optics: measuring and testing – By polarized light examination
Patent
1997-02-27
1998-03-31
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
356367, G01J 400
Patent
active
057344736
ABSTRACT:
A method for determining polarization profiles of individual wavelengths hin a polychromatic source utilizes a variable filter system comprised of a retarder and a linear polarizer. Polychromatic light from the source is transmitted through the system and exits therefrom with attenuated intensities unique for each wavelength of the light. The attenuated intensities are recorded by a spectroradiometer and used to calculate Stokes parameters for each wavelength. The inherent problem of the retarder introducing a different phase differential for each individual wavelength transmitted therethrough is solved by expressing the Stokes parameters explicitly as a function of wavelength. The primary purpose of the method is to obtain the four Stokes parameters for individual bands of wavelength within a polychromatic light beam.
REFERENCES:
patent: 3700334 (1972-10-01), Low et al.
patent: 4681450 (1987-07-01), Azzam
patent: 5227623 (1993-07-01), Heffner
patent: 5396329 (1995-03-01), Kalawsky
Gerhart Grant R.
Matchko Roy M.
Kuhn David L.
Pham Hoa Q.
Taucher Peter A.
United States of America as represented by the Secretary of the
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