Method of determining measurement bias in an emissions...

Chemistry: analytical and immunological testing – Including sample preparation – Digestion or removing interfering materials

Reexamination Certificate

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C073S001010, C073S001020, C073S023310, C422S062000, C422S083000, C422S084000, C422S085000, C422S086000, C422S087000, C422S088000, C422S089000, C422S091000, C422S092000, C422S093000, C422S094000, C422S095000, C422S096000, C422S097000, C422S098000, C436S155000, C436S158000, C436S159000, C436S116000, C436S117000, C436S118000, C436S122000, C436S133000, C436S134000, C436S136000, C436S174000, C436S178000, C436S181000

Reexamination Certificate

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10092678

ABSTRACT:
A method of determining bias in a measurement of a constituent concentration level in a sample gas is provided. The method comprises establishing a sample gas flow from an emission stream into a sample gas line of an emissions monitoring system. The method further comprises removing water from the sample gas flow and cooling the sample gas flow to a temperature below about 41° F. to produce a cooled, dried sample gas flow. The constituent concentration level is then determined for the cooled, dried sample gas flow. The method further comprises introducing a span gas having a known span gas constituent concentration level into the sample gas flow to form a combined sample and span gas flow, the span gas being introduced at a desired span gas flow rate. The method still further comprises removing water from the combined sample and span gas and cooling the combined sample and span gas to a temperature below about 41° F. to produce a cooled, dried, combined sample and span gas flow. A combined sample and span gas constituent concentration level is then determined for the cooled, dried, combined sample and span gas flow. The method also comprises determining a measurement bias using the known span gas constituent concentration level, the sample gas constituent concentration level and the combined sample and span gas constituent concentration level.

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H. Izumi. Japanese Patent Application Kokai: Sho 51-3289. Disclosure date: Jan. 12, 1976.

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