Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-02-20
2007-02-20
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S522000
Reexamination Certificate
active
10817764
ABSTRACT:
A method and system for evaluating the current-voltage characteristics of devices where negative resistance behavior is observed. More particularly the present invention relates to a method and system for evaluating accurately the electrical overstress or ESD performance of semiconductor devices during the voltage transition region (positive to negative). The method comprises applying a signal comprising at least two amplitudes within the pulse. By suitably adjusting the amplitude of the first level, such that it is high enough to trigger the device-under-test, and subsequently applying one or more levels within the same signal while keeping the device-under-test in the on-state, the device IV characteristics can be comprehensively extracted, without being limited by the system loadline. The method may use a rectangular pulse testing set-up, also known as transmission line measurement set-up, with a single loadline characteristic to determine a portion or the complete ESD characteristic of the device-under test.
REFERENCES:
patent: 4080571 (1978-03-01), Weisbrod
patent: 2004/0233713 (2004-11-01), Iwase et al.
Maloney, et al., “Transmission line pulsing techniques for circuit modeling of ESD phenomena”, EOS/ESD Symposium, pp. 49-54, Sep. 1985.
Daenen Tom
De Heyn Vincent
Iyer Natarajan Mahadeva
Thijs Steven
Vassilev Vesselin K.
Interuniversitaire Microelektronica Centrum (IMEC) vzw
Knobbe Martens Olson & Bear LLP
Raymond Edward
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