Method of determining at least one marking element on a...

Details Method of determining at least one marking element on a... Method of determining at least one marking element on a...

2008-04-22

2008-04-22

Lee, Michael G. (Department: 2876)

Registers

Records

Particular code pattern

C235S454000, C378S019000, C324S1540PB

Reexamination Certificate

active

10550342

ABSTRACT:
A method of establishing at least one marking element on a substrate (1). By means of design data of the substrate (1) at least a fictitious marking element (5) on the substrate (1) is determined. The fictitious marking element (5) should then be unique for a predefined area of the substrate (1). The fictitious marking element is obtained by selecting at least two transitions (6, 7, 17, 18) of at least one element on the substrate while the transitions (6, 7, 17, 18) enclose an angle to each other.

REFERENCES:
patent: 5974169 (1999-10-01), Bachelder
patent: WO 03/005792 (2003-01-01), None
patent: WO 03/005793 (2003-01-01), None
patent: WO03005792 (2003-01-01), None
patent: WO03005793 (2003-01-01), None
International Search Report of International Application No. PCT/IB2004/050331 Contained in International Publication No. WO2004086843.
Written Opinion of the International Searching Authority for International Application No. PCT/IB2004/050331.

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