Method of determining a scanning interval in surface inspection

Details Method of determining a scanning interval in surface inspection Method of determining a scanning interval in surface inspection

1994-10-17

1997-04-29

Le, Que T.

Radiant energy

Photocells; circuits and apparatus

With circuit for evaluating a web, strand, strip, or sheet

25055948, 348125, 382286, 356431, G01N 2186

Patent

active

056251971

ABSTRACT:
A scanning interval, at which an area illumination scans a subject surface for surface defect inspection, is determined based on a smallest histogram of histograms for a same value of picture elements of a two-valued image extracted in connection with all positions in a direction perpendicular to a scanning direction.

REFERENCES:
patent: 5319567 (1994-06-01), Ebenstein
patent: 5331408 (1994-07-01), Jordan et al.

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