X-ray or gamma ray systems or devices – Accessory – Testing or calibration
Patent
1990-01-23
1990-11-20
Howell, Janice A.
X-ray or gamma ray systems or devices
Accessory
Testing or calibration
378210, 378 99, G01D 114, H05G 102, H05G 164
Patent
active
049724517
ABSTRACT:
The modulation transfer function of a digital imaging system is measured using a test object comprising a number of slits. The effect of geometrical distortions on the MTF measurement, is minimized by making the dimension of the test object as small as possible with respect to the image detector. The minimum slit spacing d enabling suitable MTF measurement is expressed in the number of pixels N over a dimension L of the image detector: d>8L/N.
REFERENCES:
patent: 4241996 (1980-12-01), Weiser
patent: 4792900 (1988-12-01), Sones et al.
patent: 4817181 (1989-03-01), Kamiya
patent: 4907288 (1990-03-01), Shimoni
R. A. Sones, "A Method to Measure the MTF of digital X-ray Systems", Medical Physics, vol. 11, No. 2, Mar./Apr. 1984, pp. 166-171.
Brok Marius
Slump Cornelis
Howell Janice A.
Squire William
U.S. Philips Corporation
Wong Don
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