Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1988-07-05
1989-11-14
Scott, Jr., Leon
Optics: measuring and testing
By polarized light examination
With light attenuation
G01B 1114
Patent
active
048803073
ABSTRACT:
In a position detection system when a preselected parameter magnitude of a signal produced in response to a received reflected laser beam, is excessively high, the power of the laser is reduced until such a satisfactory level is reached. On the other hand when the signal level is low and laser power cannot be increased further, signal amplification is induced until such time as the required level is produced.
REFERENCES:
patent: 4299491 (1981-11-01), Waters et al.
Endo Motonori
Minakami Hiroshi
Jr. Leon Scott
Nissan Motor Co,. Ltd.
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